Technical Barriers to Trade Survey 2001-2002

World, 2001 - 2002

Get Microdata

Reference ID

WLD_2001_TBTS_v01_M

Producer(s)

John S. Wilson (World Bank), Keith E. Maskus (University of Colorado at Boulder), Tsunehiro Otsuki (Osaka University)

Metadata

DDI/XML JSON

Study website

Created on

Nov 08, 2011

Last modified

Mar 29, 2019

Page views

41165

Downloads

509

cfm_dup_exp (cfm_dup_exp)

Data file: TBTdata2

Overview

Valid: 378

Invalid: 296

Type: Discrete

Decimal: 0

Start: 82

End: 82

Width: 1

Range: -

Format:

Questions and instructions

Literal question

Extent of duplication of test to meet multiple foreign requirements

Categories

Value	Category
1	No duplication (A single test works for both)
2	Minor duplication
3	Significant duplication
4	Complete duplication (Two tests are required)
Sysmiss

Warning: these figures indicate the number of cases found in the data file. They cannot be interpreted as summary statistics of the population of interest.

Back to Catalog